Features |
Benefits |
Electrical module signal measurement accuracy:
|
<100 fs intrinsic jitter enables the characterization of high bit-rate (40 and 100 (4´25) Gb/s) devices with typically <5% of the signal’s unit interval being consumed by the test instrumentation. 70 GHz bandwidth allows full characterization of high bit-rate signals (5th harmonic to data rates of 28 Gb/sec and 3rd harmonic to data rates >45 Gb/sec). |
Industry’s lowest system noise at all bandwidths:
|
Minimizes the amount of instrumentation noise when acquiring high bit-rate, low-amplitude signals to eliminate additional noise which can exhibit itself as additional jitter and eye closure. |
| Up to 6 channels simultaneous acquisition at <100 fs jitter in a single mainframe. | High fidelity acquisition of multiple differential channels enables testing for cross channel impairments and improves the test throughput for systems with multiple high-speed serial channels. |
| Optical modules support optical compliance test of all standard rates from 155 Mb/s to 100 Gb/s (4×25) Ethernet. | Provides cost-effective and versatile optical test system for single and multi-mode optical standards from 155 Mb/s (OC3/STM1) to 40 Gb/s (SONET/SDH and 40GBase Ethernet) and 100 Gb/s Ethernet (100GBase-SR4, -LR4 and ER4) at 850, 1310 and 1550nm. |
| Superior acquisition throughput with up to 300 kS/s maximum sample rate. | Reduced manufacturing or device characterization test-time by 4X with superior system throughput. |
| Ability to place the samplers adjacent to the device under test (DUT). | Remote sampling heads minimize signal degradation due to cabling and fixturing from DUT to instrumentation and simplifies test system de-embed. |
| Independent calibrated channel de-skew. | Having integrated, calibrated channel deskew in dual channel modules, enhances signal fidelity for multi-channel measurements by eliminating skewing. |
| View Datasheet | Data Sheet | Module | Description |
|---|---|---|---|
| 82A04B | 8000 Series, Phase Reference Module (includes D1) | ||
| 80C18 | 8000 Series Optical Module: dual channel, 30GHz optical bandwidth, single/multi-mode, 800nm to 1600nm | ||
| 80C15 | 8000 Series Optical Module: single channel, 32GHz optical bandwidth, single/multi-mode, 800nm to 1600nm | ||
| 80C21 | 8000 Series Optical Module: dual channel, 53GHz optical bandwidth, single-mode, 1200nm to 1650nm | ||
| 80C08D | Single channel optical sampling module; 10G Optical Reference Receiver Filters; 12 GHz optical bandwidth; single-/multi-mode | ||
| 80E10B | 8000 Series, Dual Channel, 50 GHz, Remote Electrical Sampling Module w/ TDR (includes D1) | ||
| 80E07B | 8000 Series, Dual Channel, 30 GHz, Remote Electrical Sampling Module (includes D1) | ||
| 80C12B | 12 GHz, Broad WaveLength, Amplified Optical Sampling Module | ||
| 80C10C | Single Channel, 65/80 GHz Optical Sampling Module(must specify one of options F1, F2, or F3) | ||
| 80E08B | 8000 Series, Dual Channel, 30 GHz, Remote Electrical Sampling Module w/ TDR (includes D1) | ||
| 80N02 | 8000 Series Electrical Sampling Module Extender, 2M Cable | ||
| 80E11X1 | 8000 Series, Single Channel, 70 GHz, Ultra-low Jitter, Electrical Sampling Module (includes D1) | ||
| 80A02 | EOS/ESD PROTECTION MODULE FOR ELECTRICAL STATIC ISOLATION OF TEKTRONIX ELECTRICAL SAMPLING MODULES;STATEMENT OF COMPLIANCE INCLUDED WITH THIS PRODUCT | ||
| 80C07B | OPTICAL SAMPLING MODULE; 2.488 GB/S OC48/STM16,2.500 GB/S 2GBE,2.500 GB/S INFINIBAND;2.5 GHZ OPTICAL BANDWIDTH | ||
| 80C17 | 8000 Series Optical Module: single channel, 30GHz optical bandwidth, single/multi-mode, 800nm to 1600nm | ||
| 80C11B | Single channel optical sampling module; 10G Optical Reference Receiver Filters; 28 GHz optical bandwidth; single-mode | ||
| 80C20 | 8000 Series Optical Module: single channel, 53GHz optical bandwidth, single-mode, 1200nm to 1650nm | ||
| 80C14 | 14+ GHz, Broad WaveLength, Amplified Optical Sampling Module | ||
| 8000 Series, Dual Channel, 60 GHz, Remote Electrical Sampling Module (includes D1) | |||
| 80E11 | 8000 Series, Dual Channel, 70 GHz, Ultra-low Jitter, Electrical Sampling Module (includes D1) | ||
| 80E04 | SAMPLING MODULE; DUAL,20 GHZ W/TDR ELECTRICAL SAMPLING MODULE – CERTIFICATE OF TRACEABLE CALIBRATION STANDARD | ||
| 80E03 | SAMPLING MODULE; DUAL,20 GHZ ELECTRICAL SAMPLING MODULE – CERTIFICATE OF TRACEABLE CALIBRATION STANDARD |
| Datasheet Link | Probe | Description | Configure and Quote |
|---|---|---|---|
| DVT30-1MM GigaProbe | 30 GHz TDR probe available from GigaProbes. | Configure & Quote | |
| View Datasheet | P8018 | HANDHELD TDR PROBE, PASSIVE; 20 GHZ, SINGLE-ENDED, 50 OHM, SMA CONNECTOR WITH 20 GHZ SMA CABLE; DESIGNED TO WORK WITH 80A02 EOS/ESD PROTECTION MODULE; STATEMENT OF COMPLIANCE INCLUDED WITH THIS PRODUCT | Configure & Quote |
| View Datasheet | P80318 | Probe kit,18GHz 100 Ohm Differential Hand Probe | Configure & Quote |
| Datasheet Link | Probe | Description | Configure and Quote |
|---|---|---|---|
| View Datasheet | P7330 | PROBE; DIFFERENTIAL; 3.5 GHz BW, +/-1.75 V DIFFERENTIA.L DYNAMIC RANGE, +5V -4V COMMON MODE RANGE, 2.3 MV RMS NOISE AT INPUT, 5X ATTENTUATION – CERTIFICATE OF TRACEABLE CALIBRATION STANDARD | Configure & Quote |
| View Datasheet | P7350 | DIFFERENTIAL PROBE, 5 GHZ | Configure & Quote |
| View Datasheet | P7380SMA | 8 GHZ DIFFERENTIAL SIGNAL ACQUISITION SYSTEM WITH SMA INPUTS,CERTIFICATE OF TRACEABLE CALIBRATION STANDARD | Configure & Quote |
| Datasheet Link | Probe | Description | Configure and Quote |
|---|---|---|---|
| View Datasheet | P6150 | Passive Probe: 10X/1X, 9GHz, 12.5V low capacitance | Configure & Quote |
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